ニコン ESEM-2700L; Nikon Corporation, Tokyo, Japan. This environmental scanning electron microscope allows direct observation of wet, dry and conductive and/or non-conductive specimen. Water vapor is provided to the specimen chamber and the limited environmental gas pressure is water vapor saturation value of 2700 Pa at ambient temperature. In the low vacuum mode, the specimen chamber pressure can be regulated from 100 to 2700 Pa. The microscope is equipped with a cooling stage ( -20° from ambient temperature, heating stage (ambient to 1000°C), tensile stage; and micro-manipulator/injector, which allows dynamic observation of the behavior of manipulated specimens.

日本バイオラット MRC-1024 Confocal laser scanning microscope system (MRC 1024 T; Bio-Rad fitted to an Olympus BX60 Upright Microscope with wide-field fluorescence capability), and imaging system (LaserSharp 2000; Bio-Rad Microscience Ltd., Hertfordshire, U.K.)

オリンパス OLS-1000W

JSM 5310LV; Jeol Ltd., Tokyo, Japan, equipped with Energy Dispersive X-Ray Spectrometer (EDS) (JED-2110; Jeol Ltd., Tokyo, Japan). A high performance multipurpose scanning electron microscope capable of extending its utility from morphological observation to elemental analysis. Operable in the low vacuum (LV) mode or high vacuum (HV) mode. Low vacuum mode can be used for observation of nonconductive specimens without conductive coating.

DENDRO SR-1010